IEEE - Institute of Electrical and Electronics Engineers, Inc. - Double boundary trench isolation effects on a stacked gradient homojunction photodiode array

2008 Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD'08)

Author(s): P.V. Jansz ; S. Hinckley
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2008
Conference Location: Sydney, NSW, Australia
Conference Date: 28 July 2008
Page(s): 156 - 159
ISBN (CD): 978-1-4244-2717-8
ISBN (Paper): 978-1-4244-2716-1
ISSN (Paper): 1097-2137
DOI: 10.1109/COMMAD.2008.4802115
Regular:

The effect of the width of inter-pixel double boundary trench isolation on the response resolution of a two dimensional CMOS compatible stacked gradient homojunction photodiode array was... View More

Advertisement