IEEE - Institute of Electrical and Electronics Engineers, Inc. - Laser beam induced current for qualitative evaluation of HgCdTe van der Pauw sample uniformity

2008 Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD'08)

Author(s): B. Park ; R. Westerhout ; G. Tsen ; C. Musca ; J. Dell ; L. Faraone
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2008
Conference Location: Sydney, NSW, Australia
Conference Date: 28 July 2008
Page(s): 108 - 113
ISBN (CD): 978-1-4244-2717-8
ISBN (Paper): 978-1-4244-2716-1
ISSN (Paper): 1097-2137
DOI: 10.1109/COMMAD.2008.4802103
Regular:

HgCdTe is the preferred semiconductor for fabrication of high-performance infrared (IR) detectors. This material also typically contains multiple carrier species for charge transport, which makes... View More

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