IEEE - Institute of Electrical and Electronics Engineers, Inc. - Rapid shear wave measurement for SDUV with broadband excitation pulses and non-uniform sampling

2008 IEEE International Ultrasonics Symposium

Author(s): Yi Zheng ; Aiping Yao ; Shigao Chen ; J.F. Greenleaf
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: Beijing, China
Conference Date: 2 November 2008
Page(s): 217 - 220
ISBN (CD): 978-1-4244-2480-1
ISBN (Paper): 978-1-4244-2428-3
DOI: 10.1109/ULTSYM.2008.0053
Regular:

We propose a method using broadband tone burst excitation pulses with non-uniform sampling for Shearwave Dispersion Ultrasound Vibrometry (SDUV). The method allows long excitation pulses with a... View More

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