IEEE - Institute of Electrical and Electronics Engineers, Inc. - General analytical scheme for determining the characteristic caustic points in phonon focusing patterns of cubic crystals

2008 IEEE International Ultrasonics Symposium

Author(s): Litian Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: Beijing, China
Conference Date: 2 November 2008
Page(s): 257 - 260
ISBN (CD): 978-1-4244-2480-1
ISBN (Paper): 978-1-4244-2428-3
DOI: 10.1109/ULTSYM.2008.0063
Regular:

Phonon focusing patterns are dependent on the existence of concave/saddle regions and acoustic axes in the slowness surface. The main feature of the focusing patterns in cubic crystals can be... View More

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