IEEE - Institute of Electrical and Electronics Engineers, Inc. - Impact of runtime leakage reduction techniques on delay and power sensitivity under effective channel length variations

TENCON 2008 - 2008 IEEE Region 10 Conference

Author(s): S. Roy ; A. Pal
Sponsor(s): IEEE Region 10
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: Hyderabad, India
Conference Date: 19 November 2008
Page(s): 1 - 6
ISBN (CD): 978-1-4244-2409-2
ISBN (Paper): 978-1-4244-2408-5
DOI: 10.1109/TENCON.2008.4766400
Regular:

As the fabrication process technology has moved from submicron to deep submicron region, it has become essential to minimize the leakage power and the variability of the design parameters such as... View More

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