IEEE - Institute of Electrical and Electronics Engineers, Inc. - Area of vulnerability for prediction of voltage sags by an analytical method in indian distribution systems

INDICON 2008. IEEE India Conference and Exhibition on Control, Communications and Automation

Author(s): A.K. Goswami ; C.P. Gupta ; G.K. Singh
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Kanpur, India
Conference Date: 11 December 2008
Volume: 2
Page(s): 406 - 411
ISBN (CD): 978-1-4244-2747-5
ISBN (Paper): 978-1-4244-3825-9
DOI: 10.1109/INDCON.2008.4768758
Regular:

This paper proposes an analytical method for voltage sags prediction in distribution systems. The method is based on the ZBus matrix of the distribution network, from which one can... View More

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