IEEE - Institute of Electrical and Electronics Engineers, Inc. - Microwave Reflectometer to measure radial profile of the plasma density on SST-1 Tokamak

2008 International Conference on Recent Advances in Microwave Theory and Applications (MICROWAVE-08)

Author(s): P.K. Atrey ; N.Y. Joshi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: Jaipur, India
Conference Date: 21 November 2008
Page(s): 460 - 462
ISBN (CD): 978-1-4244-2691-1
ISBN (Paper): 978-1-4244-2690-4
DOI: 10.1109/AMTA.2008.4763046
Regular:

Ka-Band scanning frequency microwave Reflectometer is designed and developed to measure the plasma density profile in steady state plasma. It scans the full band (24-36 GHz) in 10 mus. It measures... View More

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