IEEE - Institute of Electrical and Electronics Engineers, Inc. - A proposed theoretical model of Impact Ionization rate under carrier degeneracy considering different scattering phenomena

2008 International Conference on Recent Advances in Microwave Theory and Applications (MICROWAVE-08)

Author(s): S. Banerjee ; J.P. Banerjee
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: Jaipur, India
Conference Date: 21 November 2008
Page(s): 708 - 711
ISBN (CD): 978-1-4244-2691-1
ISBN (Paper): 978-1-4244-2690-4
DOI: 10.1109/AMTA.2008.4763014
Regular:

A theoretical model of Impact Ionization rate is proposed in this paper. Multistage scattering processes are considered which incorporate electron-electron scattering, hole-hole scattering,... View More

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