IEEE - Institute of Electrical and Electronics Engineers, Inc. - Real-time environmental mode extraction of contact points described in 3 dimensional location and direction using quaternion for bilateral control

IECON 2008 - 34th Annual Conference of IEEE Industrial Electronics Society

Author(s): S. Sakaino ; T. Sato ; R. Kubo ; K. Ohnishi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: Orlando, FL, USA
Conference Date: 10 November 2008
Page(s): 2,574 - 2,579
ISBN (CD): 978-1-4244-1766-7
ISBN (Paper): 978-1-4244-1767-4
ISSN (Paper): 1553-572X
DOI: 10.1109/IECON.2008.4758362
Regular:

In this paper, real-time environmental recognition method is proposed. With this method, location of the contact points are described in three dimensions and directions of the forces are also... View More

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