IEEE - Institute of Electrical and Electronics Engineers, Inc. - Basic examination on simultaneous optimization of mechanism and control for high precision single axis stage and experimental verification

IECON 2008 - 34th Annual Conference of IEEE Industrial Electronics Society

Author(s): A. Hara ; K. Saiki ; K. Sakata ; H. Fujimoto
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: Orlando, FL, USA
Conference Date: 10 November 2008
Page(s): 2,509 - 2,514
ISBN (CD): 978-1-4244-1766-7
ISBN (Paper): 978-1-4244-1767-4
ISSN (Paper): 1553-572X
DOI: 10.1109/IECON.2008.4758351
Regular:

In this paper, simultaneous optimization of mechanism and control is discussed for a high precision stage. We pay attention to zeros of a continuous-time plant, and the relationship between a... View More

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