IEEE - Institute of Electrical and Electronics Engineers, Inc. - A novel approach of feature classification using Support Vector Data Description combined with interpolation method

IECON 2008 - 34th Annual Conference of IEEE Industrial Electronics Society

Author(s): Chi-Kai Wang ; Yung Ting ; Yi-Hung Liu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: Orlando, FL, USA
Conference Date: 10 November 2008
Page(s): 1,828 - 1,832
ISBN (CD): 978-1-4244-1766-7
ISBN (Paper): 978-1-4244-1767-4
ISSN (Paper): 1553-572X
DOI: 10.1109/IECON.2008.4758233
Regular:

In this paper, we propose a novel approach to feature classification using support vector data description (SVDD) combined with interpolation method. In SVDD, the width parameter s and the penalty... View More

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