IEEE - Institute of Electrical and Electronics Engineers, Inc. - Precise optical scanning for practical multi-applications

IECON 2008 - 34th Annual Conference of IEEE Industrial Electronics Society

Author(s): O. Sergiyenko ; V. Tyrsa ; D. Hernandez-Balbuena ; M. Rivas Lopez ; I. Rendon Lopez ; L. Devia Cruz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: Orlando, FL, USA
Conference Date: 10 November 2008
Page(s): 1,656 - 1,661
ISBN (CD): 978-1-4244-1766-7
ISBN (Paper): 978-1-4244-1767-4
ISSN (Paper): 1553-572X
DOI: 10.1109/IECON.2008.4758202
Regular:

At last decade many approaches for non-contact measurement techniques for object surfaces and approaches for 3D object recognition have been proposed; but often they still require complex and... View More

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