IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multivariate image analysis for defect identification of apple fruit images

IECON 2008 - 34th Annual Conference of IEEE Industrial Electronics Society

Author(s): K. Vijayarekha
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: Orlando, FL, USA
Conference Date: 10 November 2008
Page(s): 1,499 - 1,503
ISBN (CD): 978-1-4244-1766-7
ISBN (Paper): 978-1-4244-1767-4
ISSN (Paper): 1553-572X
DOI: 10.1109/IECON.2008.4758175
Regular:

External defect identification of apples involving humans suffer from disadvantages which can be greatly reduced using machine vision applications. The bruises appearing on the surface which may... View More

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