IEEE - Institute of Electrical and Electronics Engineers, Inc. - Categorical data analysis for equipment failure prediction

IECON 2008 - 34th Annual Conference of IEEE Industrial Electronics Society

Author(s): M. Luo ; X. Li ; D.H. Zhang ; Y.Z. Zhao ; P.C. Lim
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: Orlando, FL, USA
Conference Date: 10 November 2008
Page(s): 1,473 - 1,478
ISBN (CD): 978-1-4244-1766-7
ISBN (Paper): 978-1-4244-1767-4
ISSN (Paper): 1553-572X
DOI: 10.1109/IECON.2008.4758171
Regular:

The effective approach to monitor the health state of equipment has long been a concern of industrial applications. This paper focuses on the categorical data analysis to build equipment... View More

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