IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modeling nanoscale MOSFETs by a neural network approach

2008 IEEE International Conference on Electron Devices and Solid-State Circuits

Author(s): Min Fang ; Jin He ; Jian Zhang ; Lining Zhang ; Mansun Chan ; Chenyue Ma
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Hong Kong, China
Conference Date: 8 December 2008
Page(s): 1 - 4
ISBN (CD): 978-1-4244-2540-2
ISBN (Paper): 978-1-4244-2539-6
DOI: 10.1109/EDSSC.2008.4760660
Regular:

This paper presents modeling nanometer MOSFETs by a neural network approach. The principle of this approach is firstly introduced and its application in modeling DC and conductance characteristics... View More

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