IEEE - Institute of Electrical and Electronics Engineers, Inc. - Progress in sub-micrometer resolution computed tomography

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): Frank Nachtrab ; Michael Salamon ; Susanne Burtzlaff ; Virginia Voland ; Felix Porsch ; Wiktor Johansson ; Norman Uhlmann ; Randolf Hanke
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 532 - 535
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1082-3654
DOI: 10.1109/NSSMIC.2008.4775244
Regular:

Micro-CT with resolutions in the order of 1 μm is readily available nowadays but below 1 μm the maximum achievable resolution is not only limited by the components parameters like pixel... View More

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