IEEE - Institute of Electrical and Electronics Engineers, Inc. - Extraction of shape-fitted layers from CT-data

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): S. Mohr ; S. Gayetskyy ; U. Hassler ; R. Hanke
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 574 - 576
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4775236
Regular:

Herein we describe a new method to extract layers from computed tomography volume data of objects that have a curved surface where simple slicing does not show the desired layers. For the... View More

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