IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fabrication and test of pixelated CZT detectors with different pixel pitches and thicknesses

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): Qiang Li ; Alfred Garson ; Paul Dowkontt ; Jerrad Martin ; Matthias Beilicke ; Ira Jung ; Michael Groza ; Arnold Burger ; G. De Geronimo ; Henric Krawczynski
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 484 - 489
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4775212
Regular:

The main methods grown Cadmium Zinc Telluride (CZT) crystals with high yield and excellent homogeneity are Modified Horizontal Bridgman (MHB) and High Pressure Bridgman (HPB) processes,... View More

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