IEEE - Institute of Electrical and Electronics Engineers, Inc. - The characterization of CdTe TimePix device and the study of its capabilities for the double beta decay measurements

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): P. Cermak ; I. Stekl ; V. Bocarov ; J. Jakubek ; S. Pospisil ; M. Fiederle ; K. Zuber
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 444 - 445
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4775203
Regular:

This work aims at the characterization of cadmium-telluride detector bump-bonded on the TimePix readout chip and the evaluation of its potential as a tool to study the double beta decay... View More

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