IEEE - Institute of Electrical and Electronics Engineers, Inc. - Event classification in 3D position sensitive semiconductor detectors

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): Stephen E. Anderson ; Jaecheon Kim ; Zhong He
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 294 - 299
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4775173
Regular:

A set of analytical methods for pixelated 3D position sensitive semiconductor detectors has been developed to make better measurements of gamma-rays in the 30 keV to 3 MeV energy range. The... View More

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