IEEE - Institute of Electrical and Electronics Engineers, Inc. - X-ray performance of pixilated CdZnTe detectors

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): Matthew D. Wilson ; Paul Seller ; Conny Hansson ; Robert Cernik ; Julien Marchal ; Zhi-Jun Xin ; Veeramani Perumal ; Matthew C. Veale ; Paul Sellin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 239 - 245
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4775159
Regular:

The X-ray performance of CdZnTe detectors with 300μm pixels was investigated. 2mm thick CdZnTe from eV Products Inc. was bump bonded to ERD2004 detector modules. Preliminary experiments with... View More

Advertisement