IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characterization of bulk and surface transport mechanisms by means of the photocurrent technique

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): Massimiliano Zanichelli ; Maura Pavesi ; Andrea Zappettini ; Laura Marchini ; Manfredo Manfredi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 217 - 221
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4775154
Regular:

Crucial points for the ternary materials, as CdZnTe, for X and Gamma detectors are the transport properties related with bulk defect density and nature, and, on the other hand, the quality of... View More

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