IEEE - Institute of Electrical and Electronics Engineers, Inc. - Influence of annealing on tellurium precipitates in (Cd,Mn)Te:V crystals

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): D. Kochanowska ; A. Mycielski ; M. Witkowska-Baran ; A. Szadkowski ; B. Witkowska ; W. Kaliszek ; Y. Cui ; R. B. James
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 202 - 206
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4775153
Regular:

The authors believe that (Cd,Mn)Te can be used as a material for gamma- and X-ray detectors [1]. The investigations are concentrated on producing, by Bridgman method, of high quality (Cd,Mn)Te... View More

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