IEEE - Institute of Electrical and Electronics Engineers, Inc. - THM growth and characterization of 100 mm diameter CdTe single crystals

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): Hiroyuki Shiraki ; Minoru Funaki ; Yukio Ando ; Akira Tachibana ; Shinya Kominami ; Ryoichi Ohno
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 126 - 132
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4775138
Regular:

The THM growth technology for 100 mm diameter CdTe single crystals has been intensively developed. In consequence of the optimization of growth conditions, we have succeeded in controlling growth... View More

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