IEEE - Institute of Electrical and Electronics Engineers, Inc. - Mapping CZT charge transport parameters with collimated X-Ray and gamma-ray beams

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): Robert T. Skelton ; James L. Matteson ; Aaron C. Deal ; Edwin A. Stephan ; Bill Cardoso
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 63 - 66
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4775127
Regular:

It is desirable to characterize the charge production and transport properties of CZT wafers prior to fabrication into detectors. This allows rejection of undesirable material early in the... View More

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