IEEE - Institute of Electrical and Electronics Engineers, Inc. - Development of a radiation hard CMOS monolithic pixel sensor

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): Marco Battaglia ; Dario Bisello ; Devis Contarato ; Peter Denes ; Dionisio Doering ; Piero Giubilato ; Tae Sung Kim ; Zonghoon Lee ; Serena Mattiazzo ; Velimir Radmilovic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 3,501 - 3,504
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4775091
Regular:

This paper presents the design and experimental test results of a CMOS monolithic pixel sensor prototype with an optimized layout of the pixel cell aimed at a superior radiation tolerance. The... View More

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