IEEE - Institute of Electrical and Electronics Engineers, Inc. - SMART (Simulation of MAritime Radiological Threats)

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): Chul S. Gwon ; Elena I. Novikova ; Bernard F. Phlips ; Mark S. Strickman
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 3,494 - 3,496
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4775088
Regular:

SMART (Simulation of MAritime Radiological Threats) is a package created for simplyfing the process of modeling the performance of detector systems for identifying special nuclear materials (SNM).... View More

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