IEEE - Institute of Electrical and Electronics Engineers, Inc. - CMOS Active Pixel Sensors for Soft X-rays Detection Applications

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): D. Biagetti ; P. Delfanti ; D. Passeri ; A. Marras ; P. Placidi ; L. Servoli ; P. Ciampolini
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 3,459 - 3,463
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1082-3654
DOI: 10.1109/NSSMIC.2008.4775082
Regular:

In this work we present the characterization of CMOS Active Pixel Sensors (APS) manufactured in a standard twin-tub 0.18μm technology conceived for direct soft X-rays and MIP detection... View More

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