IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fast imaging by a single-slice-detector helical CT

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): Wenyuan Bi ; Yuxiang Xing ; Zhiqiang Chen ; Li Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 3,330 - 3,333
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4775057
Regular:

In order to accelerate imaging process and lower overall system cost, many practical CT systems use single slice detectors and big-pitch helical scanning, especially in next generation Baggage... View More

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