IEEE - Institute of Electrical and Electronics Engineers, Inc. - Development of deep N-well MAPS in a 130 nm CMOS technology and beam test results on a 4k-pixel matrix with digital sparsified readout

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): G. Rizzo ; C. Avanzini ; G. Batignani ; S. Bettarini ; F. Bosi ; G. Calderini ; M. Ceccanti ; R. Cenci ; A. Cervelli ; F. Crescioli ; M. Dell'Orso ; F. Forti ; P. Giannetti ; M.A. Giorgi ; A. Lusiani ; S. Gregucci ; P. Mammini ; G. Marchiori ; M. Massa ; F. Morsani ; N. Neri ; E. Paoloni ; M. Piendibene ; L. Sartori ; J. Walsh ; E. Yurtsev ; M. Manghisoni ; V. Re ; G. Traversi ; M. Bruschi ; R. Di Sipio ; B. Giacobbe ; A. Gabrielli ; F. Giorgi ; G. Pellegrini ; C. Sbarra ; N. Semprini ; R. Spighi ; S. Valentinetti ; M. Villa ; A. Zoccoli ; C. Andreoli ; L. Gaioni ; E. Pozzati ; L. Ratti ; V. Speziali ; D. Gamba ; G. Giraudo ; P. Mereu ; G.F. Dalla Betta ; G. Soncini ; G. Fontana ; M. Bomben ; L. Bosisio ; P. Cristaudo ; G. Giacomini ; D. Jugovaz ; L. Lanceri ; I. Rashevskaya ; L. Vitale ; G. Venier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 3,242 - 3,247
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4775038
Regular:

We report on further developments of our recently proposed design approach for a full in-pixel signal processing chain of deep n-well (DNW) MAPS sensors, by exploiting the triple well option of a... View More

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