IEEE - Institute of Electrical and Electronics Engineers, Inc. - Review of radiation effects leading to noise performance degradation in 100 - nm scale microelectronic technologies

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): Valerio Re ; Luigi Gaioni ; Massimo Manghisoni ; Lodovico Ratti ; Valeria Speziali ; Gianluca Traversi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 3,086 - 3,090
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4775008
Regular:

Advanced CMOS technologies promise to meet the demanding requirements of mixed-signal integrated circuits for detector readout in future experiments at SLHC, ILC and Super B Factory. In the... View More

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