IEEE - Institute of Electrical and Electronics Engineers, Inc. - Thick silicon drift detectors

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): Marc Christophersen ; Bernard F. Phlips
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 2,727 - 2,730
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4774938
Regular:

A new concept of silicon drift detector is presented that potentially allows much thicker devices. The detector is based on a trench array, which penetrate the bulk with different depths. Finite... View More

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