IEEE - Institute of Electrical and Electronics Engineers, Inc. - Some new photoluminescence features of W line for neutron-irradiated MCz-Si and FZ-Si

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): Barbara Surma ; Pawel Kaminski ; Artur Wnuk ; Roman Kozlowski
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 2,561 - 2,564
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1082-3654
DOI: 10.1109/NSSMIC.2008.4774879
Regular:

Photoluminescence (PL) technique has been applied to study W line (1.018 eV) features for MCz-Si and FZ-Si samples irradiated with neutron dose from 1×1015 to 3×1016... View More

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