IEEE - Institute of Electrical and Electronics Engineers, Inc. - Testing a silicon photomultiplier time-of-flight (TOF) system in Fermilab Test Beam Facility

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): A. Ronzhin ; E. Ramberg ; M. Albrow ; J. Vavra ; H. Frisch ; T. Natoli ; C. Ertley ; H. Kim ; A. Kobach ; F. Tang ; S. Wilbur ; J.-F. Genat ; E. May ; K. Byrum ; J. Anderson ; G. Drake
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 2,392 - 2,394
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4774837
Regular:

The first results from a time-of-flight beam test of silicon photomultipliers (SiPm) with quartz Cherenkov radiators obtained in the Fermilab Test Beam Facility are discussed. The timing... View More

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