IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Low Energy X-Ray Fluorescence spectrometer for elemental mapping X-Ray microscopy

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): R. Alberti ; A. Longoni ; T. Klatka ; C. Guazzoni ; A. Gianoncelli ; D. Bacescu ; B. Kaulich
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 1,564 - 1,566
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4774708
Regular:

In this work we present a recently developed Low Energy X-ray Fluorescence spectrometer (LEXRF) system combined with a soft and multi-keV X-ray Microscope. The LEXRF setup is a modular system... View More

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