IEEE - Institute of Electrical and Electronics Engineers, Inc. - New developments for CMOS SSPMs

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): Erik B. Johnson ; Christopher J. Stapels ; Mickel McClish ; Sharmistha Mukhopadhyay ; Paul Linsay ; Kanai Shah ; Paul Barton ; David Wehe ; Skip Augustine ; James F. Christian
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 1,516 - 1,522
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4774701
Regular:

A high fill factor SSPM built using a standard CMOS fabrication process can provide an energy resolution of 12.4% at 511 keV using CsI(Tl) crystals. The SSPM was operated at an excess bias of 2 V... View More

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