IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Compton-scattering coincidence system for light yield measurements on aliovalently-doped CeBr 3

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): P. Ugorowski ; M. J. Harrison ; C. Linnick ; S. Brinton ; D. S. McGregor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 1,246 - 1,250
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4774631
Regular:

A Compton-coincidence scintillator light yield proportionality measurement system was constructed and tested. Improved testing procedures and timing resolution have allowed the use of... View More

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