IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study of surface roughness of CsI:Tl crystals treated by various abrasives

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): I.V. Kilimchuk ; V.A. Tarasov ; J.M. Alameda
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 1,134 - 1,137
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4774601
Regular:

The study of the surface roughness of CsI:Tl scintillators processed by abrasives with different grain size was performed to obtain the optical characteristics that are important for simulation of... View More

Advertisement