IEEE - Institute of Electrical and Electronics Engineers, Inc. - Temperature dependence and compensation in MOS dosimeters using bias controlled cycled measurement.

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): J. Lipovetzky ; E. Redin ; M. Garcia Inza ; S. Carbonetto ; A. Faigon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 1,038 - 1,043
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4774575
Regular:

Temperature dependence of MOS dosimeters response used under the Bias Controlled Cycled Measurement technique is investigated. The use of the biasing technique allows the compensation of... View More

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