IEEE - Institute of Electrical and Electronics Engineers, Inc. - Jitter-improved sampling in micro-CT

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): Rainer Grimmer ; Michael Knaup ; Marc Kachelriess
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 5,327 - 5,331
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4774435
Regular:

Longitudinal sampling in CT in general and in circular cone-beam CT in particular is problematic because there is no source or detector motion in the direction of the z-axis. The projection of one... View More

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