IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of ray-sampling for non-circular trajectories in fan beam geometry

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): Alexander A. Zamyatin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 5,270 - 5,272
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4774423
Regular:

We propose a technique to measure sampling efficiency of various trajectories with or without detector quarter offset, and analyze aliasing artifacts caused by insufficient sampling.

Advertisement