IEEE - Institute of Electrical and Electronics Engineers, Inc. - Theoretical bounds and optimal configurations for multi-pinhole SPECT

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): Peter Nillius ; Mats Danielsson
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 5,020 - 5,022
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4774368
Regular:

The pinhole geometry in SPECT has an inherent trade-off between resolution and sensitivity. High resolution requires a small aperture which on the other hand directly reduces the rate of detected... View More

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