IEEE - Institute of Electrical and Electronics Engineers, Inc. - Estimating random coincidences from singles count rates for improved RatCAP image accuracy

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): Sudeepti Southekal ; Paul Vaska
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 4,277 - 4,279
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4774227
Regular:

The delayed coincidence window technique has been established as the standard method to estimate random coincidences in PET. It has successfully been incorporated into the RatCAP's singles list... View More

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