IEEE - Institute of Electrical and Electronics Engineers, Inc. - Performance investigation of a time-of-flight PET/CT scanner

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): B. W. Jakoby ; Y. Bercier ; M. Conti ; M. Casey ; T. Gremillion ; C. Hayden ; B. Bendriem ; D. W. Townsend
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 3,738 - 3,743
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4774221
Regular:

The physical PET performance of the first prototype of the recently introduced Biograph mCT TOF PET/CT scanner (Siemens Molecular Imaging) has been evaluated. The PET component incorporates 192... View More

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