IEEE - Institute of Electrical and Electronics Engineers, Inc. - Evaluation of the impact of resolution-sensitivity tradeoffs on detection performance for SPECT imaging

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): Evren Asma ; Ravindra Manjeshwar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 3,730 - 3,733
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4774205
Regular:

We evaluated the impact of resolution versus sensitivity tradeoffs on the detection performances of SPECT imaging systems. Images were reconstructed using penalized likelihood with quadratic... View More

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