IEEE - Institute of Electrical and Electronics Engineers, Inc. - An investigation of waveform sampling for improved signal processing in TOF PET

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): R. I. Wiener ; S. Surti ; C. C. M. Kyba ; F. M. Newcomer ; R. Van Berg ; J. S. Karp
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 4,101 - 4,105
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4774183
Regular:

The development of fast photodetectors and of fast, high light output scintillation crystals has placed an increased emphasis on the need for fast readout electronics used for Time-Of-Flight (TOF)... View More

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