IEEE - Institute of Electrical and Electronics Engineers, Inc. - Experimental evaluation of image-based spectral analysis method for multi energy window photon counting x-ray CT

2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC)

Author(s): Raz Carmi ; Amir Livne ; Asher Gringauz ; Yosef Berman ; Arkadi Fuksman ; Naor Wainer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dresden, Germany, Germany
Conference Date: 19 October 2008
Page(s): 3,903 - 3,905
ISBN (CD): 978-1-4244-2715-4
ISBN (Paper): 978-1-4244-2714-7
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2008.4774136
Regular:

Photon counting spectral x-ray CT provides powerful techniques for analyzing various materials in-situ by utilizing multiple separate energy windows. In the recent few years, preliminary results... View More

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