IEEE - Institute of Electrical and Electronics Engineers, Inc. - Evaluation methodology for fake samples detection in biometrics

42nd Annual 2008 IEEE International Carnahan Conference on Security Technology

Author(s): B. Fernandez-Saavedra ; R. Sanchez-Reillo ; R. Alonso-Moreno ; C. Sanchez-Avila
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Prague, Czech Republic
Conference Date: 13 October 2008
Page(s): 233 - 240
ISBN (CD): 978-1-4244-1817-6
ISBN (Paper): 978-1-4244-1816-9
DOI: 10.1109/CCST.2008.4751307
Regular:

Nowadays biometrics is being used in many applications where security is required. This fact causes that new threatens have appeared and that the number of attempts to break biometric systems has... View More

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