IEEE - Institute of Electrical and Electronics Engineers, Inc. - Random Noise and Coherent Interference Estimation of MT Instrument

2008 International Conference on Computer and Electrical Engineering (ICCEE)

Author(s): Chen Rujun ; He Zhanxiang ; He Lanfang ; Liu Xuejun
Sponsor(s): Int. Assoc. Comput. Sci. Inf. Technol.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Phuket, Thailand
Conference Date: 20 December 2008
Page(s): 368 - 372
ISBN (Paper): 978-0-7695-3504-3
DOI: 10.1109/ICCEE.2008.163
Regular:

Random noise and coherent interference are major factors determine the performance of MT instrument. Based on auto and cross power spectrum of channels inside MT instrument, procedure is developed... View More

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