IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability-aware Dynamic Voltage Scaling for energy-constrained real-time embedded systems

2008 IEEE International Conference on Computer Design

Author(s): Baoxian Zhao ; H. Aydin ; Dakai Zhu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Lake Tahoe, CA, USA
Conference Date: 12 October 2008
Page(s): 633 - 639
ISBN (CD): 978-1-4244-2658-4
ISBN (Paper): 978-1-4244-2657-7
ISSN (Paper): 1063-6404
DOI: 10.1109/ICCD.2008.4751927
Regular:

The dynamic voltage scaling (DVS) technique is the basis of numerous state-of-the-art energy management schemes proposed for real-time embedded systems. However, recent research has illustrated... View More

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